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Electron and Optical Microscopy

KeyLab coordinatores:

Prof. Dr. Hans-Werner Schmidt
Scanning electron microscopy (SEM)
Phone: +49 (0)921 / 55-3200
E-mail: hans-werner.schmidt@uni-bayreuth.de
Homepage: Chair of Macromolecular Chemistry I

Prof. Dr. Josef Breu
Transmission electron microscopy (TEM)
Phone: +49 (0)921 / 55-2530
E-mail: josef.breu@uni-bayreuth.de
Homepage: Chair of Inorganic Chemistry I

Prof. Dr. Jürgen Köhler
Optical microscopy (OM)
Phone: +49 (0)921 / 55-4000
E-mail: juergen.koehler@uni-bayreuth.de
Homepage: Chair of Experimental Physics IV

Youtube-Kanal Blog Kontakt

KeyLab scientists:

Dr. Markus Drechsler (TEM)
Telefon: +49 (0)921 / 55-3188
E-Mail: markus.drechsler@uni-bayreuth.de

Optical microscopy (OM)


Standard Microscope Olympus BX 60

Optical microscope for standard applications; polarized epi- and trans-illumination



Correlation Microscope Zeiss Axio Imager A2m

Precise determination of the sample coordinates for detailed study in an electron microscope Zeiss Ultra Plus 55



Fluorescence Microscope Leica DMR

Versatile fluorescence microscope with several spectral ranges of excitation and detection; spectrometer unit




Combined Raman Microscope / AFM Witec Alpha 300 RA

High-end system for combined Raman and Atomic-Force Microscopy



Inverted Polarization Microscope Nikon Eclipse Ti-S

Inverted polarization microscope with epi- and trans-illumination; Amici-Bertrand lens for conoscopic studies of crystals

Transmission electron microscopy (TEM)

Microscopy



JEOL JEM-2200FS (TEM I)

200kV EFTEM mit Schottky FEG und In-Column Omega Energiefilter




Zeiss CEM902 (TEM II)

80kV EFTEM mit Wolfram Kathode und In-Column Castaing Energiefilter




Zeiss / LEO EM922 Omega (TEM III)

200kV EFTEM mit LaB6 Kathode und In-Column Omega Energiefilter



Preparation


Ultramicrotome (Leica UC7) Room Temperature

For TEM examinations semi- and ultra-thin sections of samples are produced with the Leica EM UC7 ultramicrotome at room temperature. Furthermore smooth sample surfaces are created required for LM, SEM, and AFM experiments.



Ultramicrotome (Reichert - Jung Ultracut E) Room Temperature

For TEM examinations semi- and ultra-thin sections of samples are produced with the Reichert - Jung (now Leica Microsystems) Ultracut E ultramicrotome at room temperature. Furthermore smooth sample surfaces are created required for LM, SEM, and AFM experiments.




Jeol Cryo Ion Slicer




Plasma Cleaner (Gatan Solarus 950) Room Temperature




Glow Discharge Unit Room Temperature




Propane-Jet (Bal-Tec JFD030) Low Temperature




Plunge Freezer (Zeiss Cryo-Box) Low Temperature




Plunge Freezer (Homemade with environmental chamber) Low Temperature




Plunge Freezer (Leica EM GP) Low Temperature




Freeze-Etching Device (Bal-Tec BAF400T) Low Temperature




Freeze-Etching Device (Bal-Tec BAF060) Low Temperature




Cryoultramicrotome (Leica UC7+FC7) Low Temperature




Cryoultramicrotome (Reichert - Jung Ultracut E + FC4) Low Temperature


Scanning electron microscopy (SEM)

Microscopy

Zeiss Leo 1530 (REM I)

Hochauflösendes Feldemissions-Rasterelektronenmikroskop mit Inlens-SE-Detektor, Kammer-SE-Detektor (Everhardt Thornley), BSE-Detektor (Centaurus), Minicathodoluminiszenz-Detektor (Oxford) und UltraDry-EDX-Detektor (Thermo Fisher Scientific NS7).

Ausgerüstet für Elektronenstrahllithographie und korrelative Mikroskopie.


Zeiss Ultra plus (REM II)

Hochauflösendes Feldemissions-Rasterelektronenmikroskop mit 80 mm Probenschleuse, Inlens SE-Detektor, Kammer-SE-Detektor (Everhardt Thornley), Inlens EsB-Detektor (energy-selectiv backscattered electrons), AsB-Detektor (angle selectiv backscattered electrons) und STEM-Detektor, sowie UltraDry-EDX-Detektor (30mm²) (Thermo Fisher Scientific NS7) und Magna Ray WDX-Spektrometer (Thermo Fisher Scientific NS7).

Ausgerüstet mit Leica Cryopräparations-Transfereinheit VCT 100 und für korr. Mikroskopie.



FEI Quanta FEG 250 (REM III)

Hochauflösendes Feldemissions-Rasterelektronenmikroskop mit ET-Detektor, CBS, ICD und  STEM für HighVakuum, sowie LFD, GAD und GSED für LowVakuum, ESEM- oder WET-STEM-Messungen. Außerdem UltraDry-EDX-Detektor (100mm²) (Thermo Fisher Scientific NS7).



Preparation



Cressington Platin-Sputter Coater 208HR





Leica EM ACE 600 Kohlebedampfungsanlage



Leica EM HPM 100 Hochdrücker





Leica MED 020 Cryo-Bruch- und Sputtereinheit



Leica EM TXP Zielpräzisionsinstrument

The KeyLab Electron and Optical Microscopy combines the scientific expertise of a variety of modern microscopy techniques. High-definition scanning (coordinator: Prof. Hans-Werner Schmidt) and transmission electron microscopes (coordinator: Prof. Josef Breu) including cryo techniques are available for structural and morphological analysis.

The KeyLab Electron and Optical Microscopy comprises also various optical microscopes (coordinator: Prof. Jürgen Köhler) for standard applications, spatially resolved fluorescence and Raman spectroscopy, as well as correlative microscopy. Advanced methods for the preparation of liquid, gel, and polymer samples are available.


KeyLab coordinators:

Prof. Dr. Hans-Werner Schmidt (SEM), Prof. Dr. Josef Breu (TEM), Prof. Dr. Jürgen Köhler (OM)

KeyLab scientists:

Dr. Markus Drechsler (TEM)


KeyLab-Flyer:

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