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Electron and Optical Microscopy

KeyLab coordinatores:

Prof. Dr. Hans-Werner Schmidt
Scanning electron microscopy (SEM)
Phone: +49 (0)921 / 55-3200
E-mail: hans-werner.schmidt@uni-bayreuth.de
Homepage: Chair of Macromolecular Chemistry I

Prof. Dr. Josef Breu
Transmission electron microscopy (TEM)
Phone: +49 (0)921 / 55-2530
E-mail: josef.breu@uni-bayreuth.de
Homepage: Chair of Inorganic Chemistry I

Prof. Dr. Jürgen Köhler
Optical microscopy (OM)
Phone: +49 (0)921 / 55-4000
E-mail: juergen.koehler@uni-bayreuth.de
Homepage: Chair of Experimental Physics IV

Youtube-Kanal Blog Kontakt

KeyLab scientists:

Dr. Markus Drechsler (TEM)
Telefon: +49 (0)921 / 55-3188
E-Mail: markus.drechsler@uni-bayreuth.de

Optical microscopy (OM)


Standard Microscope Olympus BX 60

Optical microscope for standard applications; polarized epi- and trans-illumination



Correlation Microscope Zeiss Axio Imager A2m

Precise determination of the sample coordinates for detailed study in an electron microscope Zeiss Ultra Plus 55



Fluorescence Microscope Leica DMR

Versatile fluorescence microscope with several spectral ranges of excitation and detection; spectrometer unit




Combined Raman Microscope / AFM Witec Alpha 300 RA

High-end system for combined Raman and Atomic-Force Microscopy



Inverted Polarization Microscope Nikon Eclipse Ti-S

Inverted polarization microscope with epi- and trans-illumination; Amici-Bertrand lens for conoscopic studies of crystals

Transmission electron microscopy (TEM)

Microscopy



JEOL JEM-2200FS (TEM I)

200kV EFTEM mit Schottky FEG und In-Column Omega Energiefilter




Zeiss CEM902 (TEM II)

80kV EFTEM mit Wolfram Kathode und In-Column Castaing Energiefilter




Zeiss / LEO EM922 Omega (TEM III)

200kV EFTEM mit LaB6 Kathode und In-Column Omega Energiefilter



Preparation


Ultramicrotome (Leica UC7) Room Temperature

For TEM examinations semi- and ultra-thin sections of samples are produced with the Leica EM UC7 ultramicrotome at room temperature. Furthermore smooth sample surfaces are created required for LM, SEM, and AFM experiments.



Ultramicrotome (Reichert - Jung Ultracut E) Room Temperature

For TEM examinations semi- and ultra-thin sections of samples are produced with the Reichert - Jung (now Leica Microsystems) Ultracut E ultramicrotome at room temperature. Furthermore smooth sample surfaces are created required for LM, SEM, and AFM experiments.




Jeol Cryo Ion Slicer




Plasma Cleaner (Gatan Solarus 950) Room Temperature




Glow Discharge Unit Room Temperature




Propane-Jet (Bal-Tec JFD030) Low Temperature




Plunge Freezer (Zeiss Cryo-Box) Low Temperature




Plunge Freezer (Homemade with environmental chamber) Low Temperature




Plunge Freezer (Leica EM GP) Low Temperature




Freeze-Etching Device (Bal-Tec BAF400T) Low Temperature




Freeze-Etching Device (Bal-Tec BAF060) Low Temperature




Cryoultramicrotome (Leica UC7+FC7) Low Temperature




Cryoultramicrotome (Reichert - Jung Ultracut E + FC4) Low Temperature


Scanning electron microscopy (SEM)

Microscopy

Zeiss Leo 1530 (SEM I)

High resolution FEG (field emission gun) scanning electron microscope with inlens SE-detector, chamber SE-detector (Everhart-Thornley), BSE-detector (Centaurus), minicathodoluminiscence detector and UltraDry EDS-detector (Thermo Fisher Scientific, 60 mm²)

Equipped with electron beam lithography and correlative microscopy (Zeiss Shuttle & Find).


Zeiss Ultra plus (SEM II)

High resolution FEG (field emission gun) scanning electron microscope with 80 mm air lock, inlens SE-detector, chamber SE-detector (Everhart-Thornley), inlens EsB-detector (energy selective backscattered electrons), AsB-detector (angle selective backscattered electrons, 4 quadrants) and STEM-detector (Scanning Transmission Electron Microscopy). There is a gas injection charge compensation system for charging samples as well as a Peltier cooled UltraDry EDS-detector (30 mm²) and a MagnaRay WDS-spectrometer (both Thermo Fisher Scientific) for elemental analysis.

Equipped with a Leica cryo system (stage and transfer unit VCT 100) and correlative microscopy (Zeiss Shuttle & Find).



FEI Quanta FEG 250 (SEM III)

High resolution FEG (field emission gun) scanning electron microscope with ETD (Everhart-Thornley), CBS detector (concentric backscattered detector), ICD (In-column SE detector) and STEM-detector for high vacuum, as well as a LFD (Large Field detector) and CBS for low vacuum.

For ESEM mode (environmental electron microscopy) the microscope has a Peltier cooling stage and a GSED (gaseous secondary electron detector), an ESEM GAD (gaseous analytical detector for backscatter and secondary electrons) and a WET-STEM detector.

Equipped with an UltraDry EDS-detector (Thermo Fisher Scientific, 100 mm²).



Preparation



Cressington Platinum-Sputter Coater 208HR with planetary stage and quartz crystal for thickness measurement



Leica EM ACE 600 coater with planetary stage and quartz crystal for thickness measurement

Can be used either for carbon coating (carbon threads) or sputter coating (platinum) or sequential.



Leica MED 020 Preparation freeze fracture and sputter coater (tungsten) system





Leica EM HPM 100 High pressure freezer



Leica EM TXP Target Surfacing System

The KeyLab Electron and Optical Microscopy combines the scientific expertise of a variety of modern microscopy techniques. High resolution scanning (coordinator: Prof. Hans-Werner Schmidt) and transmission electron microscopes (coordinator: Prof. Josef Breu) including cryo techniques are available for structural and morphological analysis.

The KeyLab Electron and Optical Microscopy comprises also various optical microscopes (coordinator: Prof. Jürgen Köhler) for standard applications, spatially resolved fluorescence and Raman spectroscopy, as well as correlative microscopy. Advanced methods for the preparation of liquid, gel, and polymer samples are available.


KeyLab coordinators:

Prof. Dr. Hans-Werner Schmidt (SEM), Prof. Dr. Josef Breu (TEM), Prof. Dr. Jürgen Köhler (OM)

KeyLab scientists:

Dr. Markus Drechsler (TEM)


KeyLab-Flyer:

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