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Surface and Interface Characterization

KeyLab coordinator:

Prof. Dr. Georg Papastavrou
Phone: +49 (0)921 / 55-2335
E-mail: georg.papastavrou@uni-bayreuth.de
Homepage: Chair of Physical Chemistry II

Atomic Force Microscope ICON Dimension (Bruker)

This atomic force microscope is used for determining the surface topography of samples on the nm-scale. Additionally, in PeakForce Tapping mode surface it is possible to image and (semi-)quantitatively determine sample properties like adhesion and elasticity.

Atomic Force Microscope ICON Dimension for electrical, electrochemical, and thermal analysis (Bruker)

This Atomic Force Microscopy is equipped with various modules for determining electrical (e.g. local conductivity, surface potential) as well as thermal properties on the sample surface. Moreover, we can perform local electrochemical measurements (Scanning Electrochemical Microscopy, SECM).

Flex-ANA for automated nanomechanical analysis of soft samples

This system is used for the automatic analysis of the mechanical properties of soft samples such as hydrogels or polymers. It is possible to perform measurements automatically on various areas of cm-sized samples.

The KeyLab Surface and Interface Characterization applies different techniques for the quantitative analysis of interface properties of inorganic, polymeric and composite materials.

The KeyLab offers specific expertise in the field of scanning probe microscopy allowing for the characterization of surface topography, charge distribution, mechanical properties, and friction characteristics as well as adhesive and electric properties. In-situ measurements under varying sample environments, including surrounding media, temperature, humidity and electro-chemical potential, are available.

KeyLab coordinator:

Prof. Dr. Georg Papastavrou

KeyLab flyer